逢甲學報, Band 28逢甲大學, 1995 |
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... firm understanding the properties of the d - doped layers . The direct methods are SIMS and CV profiling which reflect the distribution of dopants and charges . [ 19 ] Ramman spectroscopy and X - ray were also used to invetigate how ...
... firm understanding the properties of the d - doped layers . The direct methods are SIMS and CV profiling which reflect the distribution of dopants and charges . [ 19 ] Ramman spectroscopy and X - ray were also used to invetigate how ...